TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_00_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-008-11 | FUSED_ID : 6359364768390738059
  IC_TEMP :  -63.37 | VDDM : 1124.61 | AUX_INT :   -9.74 | CsaBias :   74.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53124e-03 / 2
  ADC_P0  : -9.74492e-03 ± 2.65592e-02
  ADC_P1  : 8.44238e-03 ± 6.62038e-04
  ADC_P2  : -5.25534e-06 ± 3.29929e-06
  CSA_Chi2/NDF : 2.08839e-04 / 2
  CSA_P0  : 5.64167e-02 ± 9.63892e-03
  CSA_P1  : 1.05313e-02 ± 7.26223e-04
  CSA_P2  : -6.04472e-05 ± 1.10595e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [38, 66, 76, 77, 81, 93, 97, 108, 118, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1793', '1.800', '0.1468', '1.800', '0.0924', '7.000', '0.7073', 1, 1, 1, 1, 1725008407.3029087]
VI_after__Init : ['1.201', '0.1794', '1.800', '0.1469', '1.800', '0.0865', '7.000', '0.7076', 1, 1, 1, 1, 1725008415.500182]
VI_at__the_End : ['1.202', '0.4756', '1.800', '0.1356', '1.800', '0.1171', '7.000', '0.7083', 1, 1, 1, 1, 1725008482.1869564]