TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_50_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-014-11 | FUSED_ID : 6359364768390738155
  IC_TEMP :  -60.32 | VDDM : 1131.32 | AUX_INT :   -7.57 | CsaBias :   66.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71184e-04 / 2
  ADC_P0  : -7.56770e-03 ± 2.11067e-02
  ADC_P1  : 8.32000e-03 ± 5.19089e-04
  ADC_P2  : -5.44308e-06 ± 2.53378e-06
  CSA_Chi2/NDF : 1.49639e-04 / 2
  CSA_P0  : 6.05258e-02 ± 8.15914e-03
  CSA_P1  : 1.01005e-02 ± 6.14732e-04
  CSA_P2  : -5.43371e-05 ± 9.36164e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [57, 60, 62, 82, 84, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [24, 31, 64, 80, 99, 112, 114, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4641', '1.800', '0.1278', '1.800', '0.0967', '7.000', '0.7076', 1, 1, 1, 1, 1725007830.4572065]
VI_after__Init : ['1.201', '0.4634', '1.800', '0.1287', '1.800', '0.0910', '7.000', '0.7076', 1, 1, 1, 1, 1725007838.5626411]
VI_at__the_End : ['1.201', '0.4781', '1.800', '0.1353', '1.804', '0.1166', '7.000', '0.7091', 1, 1, 1, 1, 1725007905.9494889]