TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_47_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-016-12 | FUSED_ID : 6359364768390738188
  IC_TEMP :  -68.56 | VDDM : 1123.85 | AUX_INT :   -9.80 | CsaBias :   51.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36838e-03 / 2
  ADC_P0  : -9.80425e-03 ± 2.49930e-02
  ADC_P1  : 8.81769e-03 ± 6.26838e-04
  ADC_P2  : -7.21190e-06 ± 3.12716e-06
  CSA_Chi2/NDF : 1.69087e-04 / 2
  CSA_P0  : 5.90861e-02 ± 8.67316e-03
  CSA_P1  : 1.03089e-02 ± 6.53460e-04
  CSA_P2  : -5.91755e-05 ± 9.95142e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 102, 119, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [19, 61, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1897', '1.800', '0.1386', '1.799', '0.0905', '7.000', '0.7078', 1, 1, 1, 1, 1725007637.0069542]
VI_after__Init : ['1.201', '0.1897', '1.800', '0.1386', '1.800', '0.0846', '7.000', '0.7078', 1, 1, 1, 1, 1725007645.829241]
VI_at__the_End : ['1.202', '0.4679', '1.800', '0.1360', '1.799', '0.1205', '7.000', '0.7083', 1, 1, 1, 1, 1725007705.7817757]