TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_45_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-017-12 | FUSED_ID : 6359364768390738204
  IC_TEMP :  -76.17 | VDDM : 1129.55 | AUX_INT :   -8.38 | CsaBias :   45.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09401e-03 / 2
  ADC_P0  : -8.38472e-03 ± 2.23281e-02
  ADC_P1  : 9.09604e-03 ± 5.78658e-04
  ADC_P2  : -7.96143e-06 ± 2.96178e-06
  CSA_Chi2/NDF : 1.45138e-04 / 2
  CSA_P0  : 6.18398e-02 ± 8.03550e-03
  CSA_P1  : 1.02993e-02 ± 6.05417e-04
  CSA_P2  : -6.13384e-05 ± 9.21979e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [3, 12, 38, 51, 52, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 20, 36, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2707', '1.800', '0.1487', '1.800', '0.0985', '7.000', '0.7086', 1, 1, 1, 1, 1725007541.9921587]
VI_after__Init : ['1.202', '0.2709', '1.800', '0.1488', '1.800', '0.0910', '7.000', '0.7079', 1, 1, 1, 1, 1725007550.2714734]
VI_at__the_End : ['1.201', '0.4632', '1.800', '0.1365', '1.802', '0.1232', '7.000', '0.7084', 1, 1, 1, 1, 1725007610.4159718]