TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_44_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-018-12 | FUSED_ID : 6359364768390738220
  IC_TEMP :  -62.23 | VDDM : 1127.32 | AUX_INT :  -10.66 | CsaBias :   65.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73994e-03 / 2
  ADC_P0  : -1.06596e-02 ± 2.82512e-02
  ADC_P1  : 8.57106e-03 ± 6.92001e-04
  ADC_P2  : -6.56343e-06 ± 3.37724e-06
  CSA_Chi2/NDF : 1.72360e-04 / 2
  CSA_P0  : 5.75552e-02 ± 8.75671e-03
  CSA_P1  : 9.96743e-03 ± 6.59755e-04
  CSA_P2  : -5.39119e-05 ± 1.00473e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [42, 45, 56, 60, 73, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 18, 24, 44, 81, 99, 111, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2045', '1.800', '0.1380', '1.800', '0.0856', '7.000', '0.7075', 1, 1, 1, 1, 1725007445.038572]
VI_after__Init : ['1.201', '0.2047', '1.800', '0.1380', '1.800', '0.0798', '7.000', '0.7076', 1, 1, 1, 1, 1725007453.944944]
VI_at__the_End : ['1.202', '0.4673', '1.800', '0.1340', '1.800', '0.1189', '7.000', '0.7083', 1, 1, 1, 1, 1725007521.2198012]