TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_42_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-019-12 | FUSED_ID : 6359364768390738236
  IC_TEMP :  -58.92 | VDDM : 1130.01 | AUX_INT :  -55.79 | CsaBias :   18.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58682e-03 / 2
  ADC_P0  : -5.57944e-02 ± 2.97083e-02
  ADC_P1  : 9.30331e-03 ± 7.43378e-04
  ADC_P2  : -8.09152e-06 ± 3.67716e-06
  CSA_Chi2/NDF : 1.08955e-04 / 2
  CSA_P0  : 6.09741e-02 ± 6.96221e-03
  CSA_P1  : 9.55677e-03 ± 5.24552e-04
  CSA_P2  : -4.67493e-05 ± 7.98831e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [18, 38, 47, 52, 90, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 17, 32, 44, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4389', '1.799', '0.1698', '1.800', '0.1003', '7.000', '0.7077', 1, 1, 1, 1, 1725007348.6439571]
VI_after__Init : ['1.201', '0.4393', '1.800', '0.1708', '1.800', '0.0951', '7.000', '0.7076', 1, 1, 1, 1, 1725007356.6933117]
VI_at__the_End : ['1.201', '0.4727', '1.800', '0.1379', '1.800', '0.1170', '7.000', '0.7084', 1, 1, 1, 1, 1725007422.640341]