TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_40_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-020-12 | FUSED_ID : 6359364768390738252
  IC_TEMP :  -61.70 | VDDM : 1127.73 | AUX_INT :   -7.84 | CsaBias :   63.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00200e-03 / 2
  ADC_P0  : -7.84083e-03 ± 2.13934e-02
  ADC_P1  : 9.02542e-03 ± 5.59502e-04
  ADC_P2  : -7.24277e-06 ± 2.89499e-06
  CSA_Chi2/NDF : 1.53422e-04 / 2
  CSA_P0  : 6.16588e-02 ± 8.26164e-03
  CSA_P1  : 1.02172e-02 ± 6.22455e-04
  CSA_P2  : -5.50411e-05 ± 9.47925e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [24, 31, 66, 73, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 15, 49, 78, 83, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2337', '1.800', '0.1481', '1.800', '0.0883', '7.000', '0.7084', 1, 1, 1, 1, 1725007251.7924218]
VI_after__Init : ['1.199', '0.2336', '1.800', '0.1481', '1.800', '0.0807', '7.000', '0.7076', 1, 1, 1, 1, 1725007259.9598045]
VI_at__the_End : ['1.201', '0.4803', '1.800', '0.1377', '1.803', '0.1181', '7.000', '0.7083', 1, 1, 1, 1, 1725007320.2441707]