TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_36_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-023-12 | FUSED_ID : 6359364768390738300
  IC_TEMP :  -61.04 | VDDM : 1125.31 | AUX_INT :   -9.19 | CsaBias :   69.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26146e-03 / 2
  ADC_P0  : -9.19308e-03 ± 2.40155e-02
  ADC_P1  : 8.76648e-03 ± 6.05718e-04
  ADC_P2  : -6.82128e-06 ± 3.03662e-06
  CSA_Chi2/NDF : 1.86454e-04 / 2
  CSA_P0  : 5.94947e-02 ± 9.10768e-03
  CSA_P1  : 1.07433e-02 ± 6.86198e-04
  CSA_P2  : -6.06997e-05 ± 1.04500e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [24, 26, 42, 58, 65, 83, 96, 115, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [13, 45, 55, 92, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2278', '1.800', '0.1328', '1.800', '0.0915', '7.000', '0.7075', 1, 1, 1, 1, 1725006963.9306402]
VI_after__Init : ['1.201', '0.2278', '1.800', '0.1328', '1.800', '0.0859', '7.000', '0.7073', 1, 1, 1, 1, 1725006972.1159518]
VI_at__the_End : ['1.201', '0.4890', '1.800', '0.1371', '1.801', '0.1153', '7.001', '0.7082', 1, 1, 1, 1, 1725007032.217225]