TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_34_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-024-12 | FUSED_ID : 6359364768390738316
  IC_TEMP :  -68.21 | VDDM : 1129.69 | AUX_INT :   -7.21 | CsaBias :   62.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03043e-03 / 2
  ADC_P0  : -7.21278e-03 ± 2.17647e-02
  ADC_P1  : 8.76932e-03 ± 5.70598e-04
  ADC_P2  : -5.72680e-06 ± 2.96508e-06
  CSA_Chi2/NDF : 2.06313e-04 / 2
  CSA_P0  : 6.01053e-02 ± 9.58045e-03
  CSA_P1  : 1.05022e-02 ± 7.21818e-04
  CSA_P2  : -5.98671e-05 ± 1.09924e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 10, 33, 46, 67, 78, 81, 108, 121, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 15, 21, 31, 44, 46, 64, 80, 83, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3120', '1.800', '0.1501', '1.799', '0.0923', '7.000', '0.7073', 1, 1, 1, 1, 1725006867.5961409]
VI_after__Init : ['1.201', '0.3124', '1.800', '0.1502', '1.800', '0.0869', '7.000', '0.7074', 1, 1, 1, 1, 1725006876.416426]
VI_at__the_End : ['1.201', '0.4792', '1.800', '0.1399', '1.800', '0.1188', '7.000', '0.7081', 1, 1, 1, 1, 1725006943.1362658]