TEST_NAME : Wafer
TEST_DATE : 24_08_30-10_32_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-007-025-12 | FUSED_ID : 6359364768390738332
  IC_TEMP :  -62.89 | VDDM : 1110.16 | AUX_INT :   -7.38 | CsaBias :   60.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.70212e-04 / 2
  ADC_P0  : -7.38108e-03 ± 2.10345e-02
  ADC_P1  : 8.51301e-03 ± 5.15623e-04
  ADC_P2  : -6.79673e-06 ± 2.49056e-06
  CSA_Chi2/NDF : 1.66912e-04 / 2
  CSA_P0  : 5.74387e-02 ± 8.61720e-03
  CSA_P1  : 9.56065e-03 ± 6.49244e-04
  CSA_P2  : -4.70459e-05 ± 9.88721e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 4, 24, 46, 59, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [61, 72, 81, 100, 103, 115, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3197', '1.800', '0.1528', '1.800', '0.0957', '7.000', '0.7075', 1, 1, 1, 1, 1725006771.6665335]
VI_after__Init : ['1.201', '0.3199', '1.800', '0.1530', '1.800', '0.0896', '7.000', '0.7071', 1, 1, 1, 1, 1725006779.7450109]
VI_at__the_End : ['1.201', '0.4685', '1.800', '0.1338', '1.799', '0.1191', '7.000', '0.7080', 1, 1, 1, 1, 1725006848.771554]