TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_09_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-002-15 | FUSED_ID : 6359364768390742063
  IC_TEMP :  -71.45 | VDDM : 1122.44 | AUX_INT :   -8.29 | CsaBias :   62.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18262e-03 / 2
  ADC_P0  : -8.28845e-03 ± 2.32717e-02
  ADC_P1  : 8.89250e-03 ± 6.01089e-04
  ADC_P2  : -6.89024e-06 ± 3.07462e-06
  CSA_Chi2/NDF : 2.03258e-04 / 2
  CSA_P0  : 5.68987e-02 ± 9.50925e-03
  CSA_P1  : 9.88168e-03 ± 7.16454e-04
  CSA_P2  : -5.45055e-05 ± 1.09107e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [16, 54, 91, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 22, 42, 59, 60, 74, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2455', '1.800', '0.1343', '1.799', '0.0978', '7.000', '0.7081', 1, 1, 1, 1, 1725008983.6789434]
VI_after__Init : ['1.201', '0.2455', '1.800', '0.1345', '1.800', '0.0899', '7.000', '0.7070', 1, 1, 1, 1, 1725008991.7703602]
VI_at__the_End : ['1.201', '0.4561', '1.800', '0.1369', '1.799', '0.1230', '7.000', '0.7079', 1, 1, 1, 1, 1725009052.224667]