TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_16_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-006-15 | FUSED_ID : 6359364768390742127
  IC_TEMP :  -60.92 | VDDM : 1118.00 | AUX_INT :  -10.57 | CsaBias :   79.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70033e-03 / 2
  ADC_P0  : -1.05737e-02 ± 2.79008e-02
  ADC_P1  : 8.27663e-03 ± 6.54412e-04
  ADC_P2  : -6.42270e-06 ± 3.05303e-06
  CSA_Chi2/NDF : 1.66011e-04 / 2
  CSA_P0  : 5.65285e-02 ± 8.59392e-03
  CSA_P1  : 9.58987e-03 ± 6.47490e-04
  CSA_P2  : -4.79587e-05 ± 9.86050e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [39, 93, 110, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [16, 85, 93, 99, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2785', '1.800', '0.1448', '1.799', '0.0963', '7.000', '0.7068', 1, 1, 1, 1, 1725009368.035437]
VI_after__Init : ['1.201', '0.2787', '1.800', '0.1448', '1.800', '0.0904', '7.000', '0.7069', 1, 1, 1, 1, 1725009376.0728447]
VI_at__the_End : ['1.201', '0.4689', '1.800', '0.1345', '1.799', '0.1186', '7.000', '0.7076', 1, 1, 1, 1, 1725009436.4823785]