TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_19_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-008-15 | FUSED_ID : 6359364768390742159
  IC_TEMP :  -64.41 | VDDM : 1119.53 | AUX_INT :   -9.49 | CsaBias :   61.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34534e-03 / 2
  ADC_P0  : -9.49481e-03 ± 2.47811e-02
  ADC_P1  : 8.99578e-03 ± 6.32850e-04
  ADC_P2  : -7.69593e-06 ± 3.20531e-06
  CSA_Chi2/NDF : 1.81481e-04 / 2
  CSA_P0  : 5.98779e-02 ± 8.98541e-03
  CSA_P1  : 1.03984e-02 ± 6.76986e-04
  CSA_P2  : -5.86576e-05 ± 1.03097e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [10, 22, 51, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [16, 17, 24, 40, 41, 64, 66, 81, 106, 107, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3855', '1.800', '0.1197', '1.800', '0.0999', '7.000', '0.7072', 1, 1, 1, 1, 1725009559.969852]
VI_after__Init : ['1.201', '0.3861', '1.800', '0.1195', '1.800', '0.0942', '7.000', '0.7068', 1, 1, 1, 1, 1725009568.2130935]
VI_at__the_End : ['1.201', '0.4786', '1.800', '0.1401', '1.804', '0.1194', '7.000', '0.7078', 1, 1, 1, 1, 1725009628.0635746]