TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_20_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-009-15 | FUSED_ID : 6359364768390742175
  IC_TEMP :  -64.52 | VDDM : 1126.58 | AUX_INT :   -8.67 | CsaBias :   69.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18087e-03 / 2
  ADC_P0  : -8.67064e-03 ± 2.32540e-02
  ADC_P1  : 8.72250e-03 ± 5.89826e-04
  ADC_P2  : -6.48494e-06 ± 2.97141e-06
  CSA_Chi2/NDF : 2.12044e-04 / 2
  CSA_P0  : 6.10880e-02 ± 9.71260e-03
  CSA_P1  : 1.06286e-02 ± 7.31774e-04
  CSA_P2  : -6.08345e-05 ± 1.11441e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 46, 73, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [16, 52, 73, 81, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2306', '1.800', '0.1450', '1.799', '0.0923', '7.000', '0.7072', 1, 1, 1, 1, 1725009656.5093694]
VI_after__Init : ['1.201', '0.2307', '1.800', '0.1451', '1.800', '0.0870', '7.000', '0.7070', 1, 1, 1, 1, 1725009664.6238074]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1381', '1.799', '0.1191', '7.000', '0.7078', 1, 1, 1, 1, 1725009732.4886339]