TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_24_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-011-15 | FUSED_ID : 6359364768390742207
  IC_TEMP :  -59.13 | VDDM : 1125.31 | AUX_INT :   -8.99 | CsaBias :   66.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38517e-03 / 2
  ADC_P0  : -8.99375e-03 ± 2.52796e-02
  ADC_P1  : 8.37852e-03 ± 6.33661e-04
  ADC_P2  : -4.82626e-06 ± 3.17312e-06
  CSA_Chi2/NDF : 1.67667e-04 / 2
  CSA_P0  : 5.87391e-02 ± 8.63665e-03
  CSA_P1  : 1.04127e-02 ± 6.50710e-04
  CSA_P2  : -5.74624e-05 ± 9.90954e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [4, 11, 14, 60, 75, 93, 96, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [22, 25, 29, 35, 62, 65, 73, 92, 115, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3011', '1.800', '0.1641', '1.800', '0.0950', '7.000', '0.7081', 1, 1, 1, 1, 1725009842.0572736]
VI_after__Init : ['1.201', '0.3016', '1.800', '0.1643', '1.800', '0.0874', '7.000', '0.7070', 1, 1, 1, 1, 1725009850.951546]
VI_at__the_End : ['1.201', '0.4797', '1.803', '0.1378', '1.800', '0.1173', '7.000', '0.7081', 1, 1, 1, 1, 1725009910.5100615]