TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_32_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-016-08 | FUSED_ID : 6359364768390742280
  IC_TEMP :  -59.79 | VDDM : 1127.06 | AUX_INT :   -7.29 | CsaBias :   68.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.97934e-04 / 2
  ADC_P0  : -7.29263e-03 ± 2.13961e-02
  ADC_P1  : 8.48387e-03 ± 5.35505e-04
  ADC_P2  : -5.84396e-06 ± 2.65266e-06
  CSA_Chi2/NDF : 1.53251e-04 / 2
  CSA_P0  : 6.15303e-02 ± 8.25704e-03
  CSA_P1  : 1.01916e-02 ± 6.22109e-04
  CSA_P2  : -5.45757e-05 ± 9.47398e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [22, 26, 52, 62, 76, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 63, 92, 96, 112, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2260', '1.800', '0.1349', '1.800', '0.0891', '7.000', '0.7086', 1, 1, 1, 1, 1725010323.4635162]
VI_after__Init : ['1.201', '0.2260', '1.800', '0.1349', '1.800', '0.0817', '7.000', '0.7075', 1, 1, 1, 1, 1725010332.25181]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1394', '1.800', '0.1162', '7.000', '0.7083', 1, 1, 1, 1, 1725010396.435844]