TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_35_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-018-08 | FUSED_ID : 6359364768390742312
  IC_TEMP :  -59.73 | VDDM : 1131.87 | AUX_INT :   -7.17 | CsaBias :   68.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12624e-03 / 2
  ADC_P0  : -7.17062e-03 ± 2.27124e-02
  ADC_P1  : 8.51018e-03 ± 5.65337e-04
  ADC_P2  : -6.11036e-06 ± 2.78724e-06
  CSA_Chi2/NDF : 1.18349e-04 / 2
  CSA_P0  : 6.23634e-02 ± 7.25613e-03
  CSA_P1  : 1.01085e-02 ± 5.46697e-04
  CSA_P2  : -5.34052e-05 ± 8.32555e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [27, 28, 46, 59, 61, 80, 83, 96, 108, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [30, 38, 97, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2492', '1.800', '0.1936', '1.800', '0.0919', '7.000', '0.7077', 1, 1, 1, 1, 1725010517.5232422]
VI_after__Init : ['1.202', '0.2493', '1.800', '0.1933', '1.800', '0.0862', '7.000', '0.7076', 1, 1, 1, 1, 1725010526.3135817]
VI_at__the_End : ['1.201', '0.4817', '1.800', '0.1405', '1.800', '0.1171', '7.000', '0.7083', 1, 1, 1, 1, 1725010592.3644314]