TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_36_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-019-08 | FUSED_ID : 6359364768390742328
  IC_TEMP :  -58.07 | VDDM : 1123.30 | AUX_INT :   -9.36 | CsaBias :   74.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53531e-03 / 2
  ADC_P0  : -9.35956e-03 ± 2.65780e-02
  ADC_P1  : 8.46735e-03 ± 6.58145e-04
  ADC_P2  : -5.80938e-06 ± 3.24269e-06
  CSA_Chi2/NDF : 1.47188e-04 / 2
  CSA_P0  : 5.98059e-02 ± 8.09204e-03
  CSA_P1  : 1.00348e-02 ± 6.09677e-04
  CSA_P2  : -5.14052e-05 ± 9.28465e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [10, 11, 19, 33, 50, 52, 57, 63, 79, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [12, 34, 65, 94, 110, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3346', '1.800', '0.1454', '1.800', '0.0971', '7.000', '0.7076', 1, 1, 1, 1, 1725010614.0188272]
VI_after__Init : ['1.202', '0.3347', '1.800', '0.1454', '1.799', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1725010622.2010467]
VI_at__the_End : ['1.201', '0.4837', '1.800', '0.1375', '1.800', '0.1174', '7.000', '0.7083', 1, 1, 1, 1, 1725010688.6739473]