TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_38_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-020-08 | FUSED_ID : 6359364768390742344
  IC_TEMP :  -61.86 | VDDM : 1123.09 | AUX_INT :   -8.68 | CsaBias :   53.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17814e-03 / 2
  ADC_P0  : -8.68182e-03 ± 2.32429e-02
  ADC_P1  : 8.87057e-03 ± 6.04455e-04
  ADC_P2  : -6.34046e-06 ± 3.12857e-06
  CSA_Chi2/NDF : 1.85638e-04 / 2
  CSA_P0  : 6.08992e-02 ± 9.08774e-03
  CSA_P1  : 1.07799e-02 ± 6.84696e-04
  CSA_P2  : -6.19084e-05 ± 1.04271e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 10, 16, 65, 69, 72, 77, 114, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [20, 24, 25, 36, 37, 42, 51, 71, 82, 103, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3040', '1.800', '0.1794', '1.800', '0.0881', '7.000', '0.7076', 1, 1, 1, 1, 1725010710.2242994]
VI_after__Init : ['1.201', '0.3042', '1.800', '0.1795', '1.800', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1725010718.427592]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1416', '1.800', '0.1184', '7.000', '0.7084', 1, 1, 1, 1, 1725010776.4680672]