TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_40_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-021-08 | FUSED_ID : 6359364768390742360
  IC_TEMP :  -56.42 | VDDM : 1120.22 | AUX_INT :   -9.50 | CsaBias :   64.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36619e-03 / 2
  ADC_P0  : -9.49843e-03 ± 2.50330e-02
  ADC_P1  : 8.28242e-03 ± 6.03887e-04
  ADC_P2  : -5.59250e-06 ± 2.90497e-06
  CSA_Chi2/NDF : 1.53341e-04 / 2
  CSA_P0  : 5.88843e-02 ± 8.25947e-03
  CSA_P1  : 9.86018e-03 ± 6.22291e-04
  CSA_P2  : -4.82313e-05 ± 9.47676e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 8, 15, 26, 27, 30, 32, 54, 58, 68, 81, 89, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [18, 19, 21, 28, 75, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3762', '1.800', '0.1510', '1.800', '0.0968', '7.000', '0.7085', 1, 1, 1, 1, 1725010806.627682]
VI_after__Init : ['1.201', '0.3766', '1.800', '0.1507', '1.799', '0.0892', '7.000', '0.7078', 1, 1, 1, 1, 1725010814.6612117]
VI_at__the_End : ['1.202', '0.4843', '1.800', '0.1375', '1.800', '0.1160', '7.000', '0.7086', 1, 1, 1, 1, 1725010881.3229365]