TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_41_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-008-022-08 | FUSED_ID : 6359364768390742376
  IC_TEMP :  -54.59 | VDDM : 1120.73 | AUX_INT :   -7.80 | CsaBias :   77.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.41137e-04 / 2
  ADC_P0  : -7.79948e-03 ± 2.07435e-02
  ADC_P1  : 8.63542e-03 ± 5.24309e-04
  ADC_P2  : -6.20365e-06 ± 2.62878e-06
  CSA_Chi2/NDF : 1.40422e-04 / 2
  CSA_P0  : 5.92929e-02 ± 7.90387e-03
  CSA_P1  : 9.86456e-03 ± 5.95500e-04
  CSA_P2  : -4.76407e-05 ± 9.06875e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 17, 30, 40, 50, 54, 59, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [46, 71, 100, 108, 109, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2889', '1.800', '0.1718', '1.800', '0.0907', '7.000', '0.7077', 1, 1, 1, 1, 1725010902.0794158]
VI_after__Init : ['1.201', '0.2888', '1.800', '0.1719', '1.800', '0.0850', '7.000', '0.7077', 1, 1, 1, 1, 1725010910.197772]
VI_at__the_End : ['1.201', '0.4864', '1.800', '0.1377', '1.800', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1725010977.3025725]