TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_31_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-002-02 | FUSED_ID : 6359364768390746146
  IC_TEMP :  -63.10 | VDDM : 1119.59 | AUX_INT :   -8.38 | CsaBias :   78.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20244e-03 / 2
  ADC_P0  : -8.37941e-03 ± 2.34502e-02
  ADC_P1  : 8.74670e-03 ± 5.90908e-04
  ADC_P2  : -6.99234e-06 ± 2.94289e-06
  CSA_Chi2/NDF : 1.52247e-04 / 2
  CSA_P0  : 5.90205e-02 ± 8.22995e-03
  CSA_P1  : 9.68223e-03 ± 6.20067e-04
  CSA_P2  : -4.58463e-05 ± 9.44289e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 45, 48, 49, 53, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 4, 15, 54, 66, 72, 86, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2013', '1.800', '0.1474', '1.800', '0.0940', '7.000', '0.7077', 1, 1, 1, 1, 1725013879.2289164]
VI_after__Init : ['1.202', '0.2013', '1.800', '0.1473', '1.800', '0.0879', '7.000', '0.7076', 1, 1, 1, 1, 1725013887.261267]
VI_at__the_End : ['1.202', '0.4828', '1.800', '0.1405', '1.800', '0.1167', '7.000', '0.7086', 1, 1, 1, 1, 1725013950.7502713]