TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_29_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-003-02 | FUSED_ID : 6359364768390746162
  IC_TEMP :  -62.73 | VDDM : 1124.55 | AUX_INT :   -7.88 | CsaBias :   59.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21320e-03 / 2
  ADC_P0  : -7.87789e-03 ± 2.36350e-02
  ADC_P1  : 8.49515e-03 ± 5.98905e-04
  ADC_P2  : -5.38495e-06 ± 3.01234e-06
  CSA_Chi2/NDF : 1.79688e-04 / 2
  CSA_P0  : 6.03806e-02 ± 8.94091e-03
  CSA_P1  : 1.01645e-02 ± 6.73633e-04
  CSA_P2  : -5.33646e-05 ± 1.02586e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 54, 91, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 9, 24, 28, 35, 53, 78, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4006', '1.800', '0.1859', '1.800', '0.0995', '7.000', '0.7086', 1, 1, 1, 1, 1725013782.6424162]
VI_after__Init : ['1.201', '0.4012', '1.800', '0.1861', '1.800', '0.0924', '7.000', '0.7076', 1, 1, 1, 1, 1725013790.7917984]
VI_at__the_End : ['1.201', '0.4842', '1.800', '0.1418', '1.800', '0.1200', '7.000', '0.7084', 1, 1, 1, 1, 1725013849.896199]