TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_24_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-006-02 | FUSED_ID : 6359364768390746210
  IC_TEMP :  -59.04 | VDDM : 1123.71 | AUX_INT :   -8.52 | CsaBias :   74.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25737e-03 / 2
  ADC_P0  : -8.52239e-03 ± 2.40341e-02
  ADC_P1  : 8.38787e-03 ± 5.93101e-04
  ADC_P2  : -5.59777e-06 ± 2.90857e-06
  CSA_Chi2/NDF : 1.94580e-04 / 2
  CSA_P0  : 6.01665e-02 ± 9.30404e-03
  CSA_P1  : 1.03285e-02 ± 7.00992e-04
  CSA_P2  : -5.41854e-05 ± 1.06753e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [62, 68, 75, 88, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [43, 99, 105, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3547', '1.800', '0.1598', '1.800', '0.0897', '7.000', '0.7077', 1, 1, 1, 1, 1725013494.9279094]
VI_after__Init : ['1.202', '0.3548', '1.800', '0.1599', '1.800', '0.0843', '7.000', '0.7076', 1, 1, 1, 1, 1725013503.0303252]
VI_at__the_End : ['1.197', '0.4945', '1.800', '0.1406', '1.800', '0.1150', '7.000', '0.7082', 1, 1, 1, 1, 1725013564.7424612]