TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_23_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-007-02 | FUSED_ID : 6359364768390746226
  IC_TEMP :  -60.19 | VDDM : 1130.43 | AUX_INT :   -7.52 | CsaBias :   68.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01293e-03 / 2
  ADC_P0  : -7.52358e-03 ± 2.15630e-02
  ADC_P1  : 8.45699e-03 ± 5.41492e-04
  ADC_P2  : -5.50143e-06 ± 2.69770e-06
  CSA_Chi2/NDF : 1.79339e-04 / 2
  CSA_P0  : 6.14006e-02 ± 8.93223e-03
  CSA_P1  : 1.00526e-02 ± 6.72979e-04
  CSA_P2  : -5.08224e-05 ± 1.02487e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [22, 24, 69, 80, 90, 118, 122, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 30, 51, 87, 106, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1827', '1.800', '0.1489', '1.800', '0.0863', '7.000', '0.7076', 1, 1, 1, 1, 1725013398.305492]
VI_after__Init : ['1.201', '0.1827', '1.800', '0.1489', '1.800', '0.0806', '7.000', '0.7074', 1, 1, 1, 1, 1725013406.3928149]
VI_at__the_End : ['1.201', '0.4884', '1.800', '0.1405', '1.800', '0.1174', '7.000', '0.7083', 1, 1, 1, 1, 1725013466.4171305]