TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_18_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-010-02 | FUSED_ID : 6359364768390746274
  IC_TEMP :  -59.93 | VDDM : 1122.25 | AUX_INT :   -8.15 | CsaBias :   66.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05501e-03 / 2
  ADC_P0  : -8.15286e-03 ± 2.19821e-02
  ADC_P1  : 8.34493e-03 ± 5.37681e-04
  ADC_P2  : -5.68773e-06 ± 2.61227e-06
  CSA_Chi2/NDF : 1.78616e-04 / 2
  CSA_P0  : 6.07633e-02 ± 8.91420e-03
  CSA_P1  : 1.03279e-02 ± 6.71620e-04
  CSA_P2  : -5.69915e-05 ± 1.02280e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 21, 83, 99, 106, 114, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [31, 57, 74, 88, 91, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2683', '1.800', '0.1765', '1.800', '0.0939', '7.000', '0.7073', 1, 1, 1, 1, 1725013108.957238]
VI_after__Init : ['1.201', '0.2682', '1.800', '0.1765', '1.800', '0.0880', '7.000', '0.7070', 1, 1, 1, 1, 1725013117.7966237]
VI_at__the_End : ['1.201', '0.4780', '1.802', '0.1405', '1.800', '0.1177', '7.000', '0.7082', 1, 1, 1, 1, 1725013182.6905117]