TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_15_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-012-02 | FUSED_ID : 6359364768390746306
  IC_TEMP :  -55.08 | VDDM : 1123.85 | AUX_INT :   -8.55 | CsaBias :   73.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21515e-03 / 2
  ADC_P0  : -8.54755e-03 ± 2.36189e-02
  ADC_P1  : 8.22964e-03 ± 5.71021e-04
  ADC_P2  : -5.41393e-06 ± 2.74448e-06
  CSA_Chi2/NDF : 1.75656e-04 / 2
  CSA_P0  : 6.00769e-02 ± 8.84003e-03
  CSA_P1  : 1.02453e-02 ± 6.66033e-04
  CSA_P2  : -5.33821e-05 ± 1.01429e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 27, 28, 37, 61, 101, 114, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [6, 40, 47, 62, 73, 80, 96, 111, 114, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2884', '1.800', '0.1425', '1.800', '0.0908', '7.000', '0.7071', 1, 1, 1, 1, 1725012916.645694]
VI_after__Init : ['1.201', '0.2885', '1.800', '0.1425', '1.800', '0.0851', '7.000', '0.7072', 1, 1, 1, 1, 1725012924.6689968]
VI_at__the_End : ['1.201', '0.4866', '1.800', '0.1392', '1.800', '0.1135', '7.000', '0.7076', 1, 1, 1, 1, 1725012989.8567772]