TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_08_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-016-05 | FUSED_ID : 6359364768390746373
  IC_TEMP :  -61.26 | VDDM : 1131.73 | AUX_INT :   -9.06 | CsaBias :   53.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25633e-03 / 2
  ADC_P0  : -9.06225e-03 ± 2.39746e-02
  ADC_P1  : 8.93157e-03 ± 6.17787e-04
  ADC_P2  : -7.00969e-06 ± 3.16293e-06
  CSA_Chi2/NDF : 1.66076e-04 / 2
  CSA_P0  : 6.24726e-02 ± 8.59559e-03
  CSA_P1  : 1.06261e-02 ± 6.47616e-04
  CSA_P2  : -5.84157e-05 ± 9.86242e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 14, 32, 58, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 26, 49, 87, 92, 93, 95, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3821', '1.800', '0.1333', '1.800', '0.0930', '7.000', '0.7079', 1, 1, 1, 1, 1725012532.0438282]
VI_after__Init : ['1.201', '0.3823', '1.800', '0.1334', '1.800', '0.0855', '7.000', '0.7069', 1, 1, 1, 1, 1725012540.218298]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1432', '1.800', '0.1155', '7.000', '0.7075', 1, 1, 1, 1, 1725012598.7034407]