TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_05_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-018-05 | FUSED_ID : 6359364768390746405
  IC_TEMP :  -65.94 | VDDM : 1119.46 | AUX_INT :  -10.22 | CsaBias :   64.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61897e-03 / 2
  ADC_P0  : -1.02215e-02 ± 2.72708e-02
  ADC_P1  : 8.35444e-03 ± 6.60089e-04
  ADC_P2  : -5.78200e-06 ± 3.18990e-06
  CSA_Chi2/NDF : 1.50927e-04 / 2
  CSA_P0  : 6.13086e-02 ± 8.19418e-03
  CSA_P1  : 1.02223e-02 ± 6.17373e-04
  CSA_P2  : -5.82266e-05 ± 9.40185e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 11, 33, 36, 46, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 13, 47, 85, 110, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2900', '1.800', '0.1680', '1.800', '0.0972', '7.000', '0.7069', 1, 1, 1, 1, 1725012338.711933]
VI_after__Init : ['1.202', '0.2900', '1.800', '0.1681', '1.800', '0.0915', '7.000', '0.7070', 1, 1, 1, 1, 1725012346.7873285]
VI_at__the_End : ['1.201', '0.4710', '1.801', '0.1408', '1.800', '0.1194', '7.000', '0.7076', 1, 1, 1, 1, 1725012410.3880517]