TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_56_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-024-05 | FUSED_ID : 6359364768390746501
  IC_TEMP :  -60.49 | VDDM : 1124.46 | AUX_INT :   -7.72 | CsaBias :   65.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21229e-03 / 2
  ADC_P0  : -7.72079e-03 ± 2.35944e-02
  ADC_P1  : 8.21160e-03 ± 5.69822e-04
  ADC_P2  : -5.58310e-06 ± 2.72116e-06
  CSA_Chi2/NDF : 1.80959e-04 / 2
  CSA_P0  : 5.96060e-02 ± 8.97248e-03
  CSA_P1  : 1.00645e-02 ± 6.76011e-04
  CSA_P2  : -5.18325e-05 ± 1.02949e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 35, 59, 93, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 45, 92, 106, 109, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1855', '1.800', '0.1341', '1.800', '0.0860', '7.000', '0.7072', 1, 1, 1, 1, 1725011768.465633]
VI_after__Init : ['1.201', '0.1855', '1.800', '0.1341', '1.800', '0.0803', '7.000', '0.7072', 1, 1, 1, 1, 1725011777.426888]
VI_at__the_End : ['1.201', '0.4843', '1.800', '0.1336', '1.800', '0.1160', '7.000', '0.7079', 1, 1, 1, 1, 1725011843.1998928]