TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_54_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-025-05 | FUSED_ID : 6359364768390746517
  IC_TEMP :  -56.81 | VDDM : 1123.08 | AUX_INT :   -8.21 | CsaBias :   73.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43093e-03 / 2
  ADC_P0  : -8.20960e-03 ± 2.56796e-02
  ADC_P1  : 8.23949e-03 ± 6.27603e-04
  ADC_P2  : -5.24210e-06 ± 3.04147e-06
  CSA_Chi2/NDF : 1.17802e-04 / 2
  CSA_P0  : 5.92523e-02 ± 7.23935e-03
  CSA_P1  : 9.56732e-03 ± 5.45433e-04
  CSA_P2  : -4.43619e-05 ± 8.30630e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 13, 33, 38, 71, 90, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [41, 64]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3266', '1.800', '0.1735', '1.800', '0.0929', '7.000', '0.7074', 1, 1, 1, 1, 1725011672.6779795]
VI_after__Init : ['1.201', '0.3267', '1.800', '0.1737', '1.800', '0.0878', '7.000', '0.7073', 1, 1, 1, 1, 1725011680.7283323]
VI_at__the_End : ['1.201', '0.4836', '1.805', '0.1362', '1.800', '0.1140', '7.000', '0.7079', 1, 1, 1, 1, 1725011748.9850535]