TEST_NAME : Wafer
TEST_DATE : 24_08_30-11_52_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-009-026-05 | FUSED_ID : 6359364768390746533
  IC_TEMP :  -59.47 | VDDM : 1118.91 | AUX_INT :   -8.12 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09631e-03 / 2
  ADC_P0  : -8.11661e-03 ± 2.24012e-02
  ADC_P1  : 8.37094e-03 ± 5.46174e-04
  ADC_P2  : -6.00807e-06 ± 2.63882e-06
  CSA_Chi2/NDF : 1.85294e-04 / 2
  CSA_P0  : 5.94924e-02 ± 9.07931e-03
  CSA_P1  : 1.02046e-02 ± 6.84061e-04
  CSA_P2  : -5.34871e-05 ± 1.04174e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 37, 49, 54, 98, 101, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 36, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1596', '1.800', '0.1355', '1.800', '0.0845', '7.000', '0.7077', 1, 1, 1, 1, 1725011576.6033666]
VI_after__Init : ['1.201', '0.1596', '1.800', '0.1355', '1.800', '0.0787', '7.000', '0.7074', 1, 1, 1, 1, 1725011584.7397153]
VI_at__the_End : ['1.197', '0.4853', '1.800', '0.1368', '1.800', '0.1163', '7.000', '0.7083', 1, 1, 1, 1, 1725011651.9145367]