TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_32_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-002-12 | FUSED_ID : 6359364768390750252
  IC_TEMP :  -62.96 | VDDM : 1119.24 | AUX_INT :   -8.27 | CsaBias :   61.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19716e-03 / 2
  ADC_P0  : -8.26836e-03 ± 2.33987e-02
  ADC_P1  : 8.74136e-03 ± 5.89611e-04
  ADC_P2  : -6.97729e-06 ± 2.93643e-06
  CSA_Chi2/NDF : 1.62655e-04 / 2
  CSA_P0  : 5.64696e-02 ± 8.50661e-03
  CSA_P1  : 9.98511e-03 ± 6.40911e-04
  CSA_P2  : -5.08778e-05 ± 9.76032e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 11, 60, 92, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 44, 71, 100, 102, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1717', '1.800', '0.1169', '1.800', '0.0894', '7.000', '0.7078', 1, 1, 1, 1, 1725013974.971414]
VI_after__Init : ['1.201', '0.1718', '1.800', '0.1169', '1.800', '0.0840', '7.000', '0.7076', 1, 1, 1, 1, 1725013983.7846315]
VI_at__the_End : ['1.201', '0.4791', '1.800', '0.1377', '1.800', '0.1173', '7.000', '0.7085', 1, 1, 1, 1, 1725014046.473886]