TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_34_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-003-12 | FUSED_ID : 6359364768390750268
  IC_TEMP :  -63.86 | VDDM : 1125.54 | AUX_INT :   -9.13 | CsaBias :   59.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33709e-03 / 2
  ADC_P0  : -9.13147e-03 ± 2.47822e-02
  ADC_P1  : 8.57509e-03 ± 6.23105e-04
  ADC_P2  : -5.82496e-06 ± 3.12204e-06
  CSA_Chi2/NDF : 2.02338e-04 / 2
  CSA_P0  : 6.11323e-02 ± 9.48771e-03
  CSA_P1  : 1.04451e-02 ± 7.14830e-04
  CSA_P2  : -5.66299e-05 ± 1.08860e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 36, 51, 59, 71, 73, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [38, 54, 62, 80, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2711', '1.800', '0.1624', '1.800', '0.0921', '7.000', '0.7077', 1, 1, 1, 1, 1725014071.4279487]
VI_after__Init : ['1.201', '0.2711', '1.800', '0.1624', '1.799', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1725014080.2331061]
VI_at__the_End : ['1.201', '0.4910', '1.799', '0.1429', '1.800', '0.1183', '7.000', '0.7086', 1, 1, 1, 1, 1725014146.9640117]