TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_36_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-004-12 | FUSED_ID : 6359364768390750284
  IC_TEMP :  -63.10 | VDDM : 1119.53 | AUX_INT :   -7.49 | CsaBias :   76.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05198e-03 / 2
  ADC_P0  : -7.48560e-03 ± 2.19678e-02
  ADC_P1  : 8.48041e-03 ± 5.49815e-04
  ADC_P2  : -5.84777e-06 ± 2.72355e-06
  CSA_Chi2/NDF : 1.73816e-04 / 2
  CSA_P0  : 5.93027e-02 ± 8.79361e-03
  CSA_P1  : 1.01479e-02 ± 6.62535e-04
  CSA_P2  : -5.23012e-05 ± 1.00896e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [19, 29, 34, 59, 60]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 15, 29, 70, 74, 83, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1670', '1.800', '0.1986', '1.800', '0.0872', '7.000', '0.7079', 1, 1, 1, 1, 1725014167.895377]
VI_after__Init : ['1.201', '0.1670', '1.800', '0.1985', '1.800', '0.0814', '7.000', '0.7078', 1, 1, 1, 1, 1725014176.780753]
VI_at__the_End : ['1.201', '0.4864', '1.800', '0.1394', '1.800', '0.1157', '7.000', '0.7090', 1, 1, 1, 1, 1725014239.7057703]