TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_37_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-005-12 | FUSED_ID : 6359364768390750300
  IC_TEMP :  -56.55 | VDDM : 1123.61 | AUX_INT :   -7.52 | CsaBias :   59.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01293e-03 / 2
  ADC_P0  : -7.52358e-03 ± 2.15630e-02
  ADC_P1  : 8.45699e-03 ± 5.41492e-04
  ADC_P2  : -5.50143e-06 ± 2.69770e-06
  CSA_Chi2/NDF : 1.16927e-04 / 2
  CSA_P0  : 6.16820e-02 ± 7.21240e-03
  CSA_P1  : 1.01695e-02 ± 5.43402e-04
  CSA_P2  : -5.24375e-05 ± 8.27538e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 3, 58, 74, 79, 80, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [81, 99, 108, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2673', '1.800', '0.1435', '1.799', '0.0878', '7.000', '0.7078', 1, 1, 1, 1, 1725014265.6526587]
VI_after__Init : ['1.201', '0.2674', '1.800', '0.1434', '1.800', '0.0824', '7.000', '0.7082', 1, 1, 1, 1, 1725014273.6370862]
VI_at__the_End : ['1.201', '0.4886', '1.800', '0.1403', '1.800', '0.1160', '7.000', '0.7086', 1, 1, 1, 1, 1725014335.5572577]