TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_39_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-006-12 | FUSED_ID : 6359364768390750316
  IC_TEMP :  -54.74 | VDDM : 1126.58 | AUX_INT :   -8.39 | CsaBias :   66.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.46797e-04 / 2
  CSA_P0  : 6.01712e-02 ± 8.08130e-03
  CSA_P1  : 1.02311e-02 ± 6.08867e-04
  CSA_P2  : -5.22177e-05 ± 9.27233e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [39, 65, 89, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [21, 41, 66, 85, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2172', '1.800', '0.1580', '1.800', '0.0937', '7.000', '0.7088', 1, 1, 1, 1, 1725014361.275377]
VI_after__Init : ['1.202', '0.2173', '1.800', '0.1577', '1.800', '0.0863', '7.000', '0.7078', 1, 1, 1, 1, 1725014369.3017175]
VI_at__the_End : ['1.201', '0.4932', '1.800', '0.1389', '1.802', '0.1153', '7.000', '0.7086', 1, 1, 1, 1, 1725014429.220112]