TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_42_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-008-12 | FUSED_ID : 6359364768390750348
  IC_TEMP :  -54.50 | VDDM : 1102.94 | AUX_INT :   -6.62 | CsaBias :   69.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.05671e-04 / 2
  ADC_P0  : -6.62105e-03 ± 1.79420e-02
  ADC_P1  : 8.55456e-03 ± 4.50429e-04
  ADC_P2  : -6.22373e-06 ± 2.23489e-06
  CSA_Chi2/NDF : 1.41579e-04 / 2
  CSA_P0  : 6.07551e-02 ± 7.93637e-03
  CSA_P1  : 9.90234e-03 ± 5.97949e-04
  CSA_P2  : -4.67163e-05 ± 9.10605e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [14, 78, 81, 82, 88, 90, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [27, 30, 52, 54, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4284', '1.800', '0.1742', '1.800', '0.0975', '7.000', '0.7074', 1, 1, 1, 1, 1725014553.1888936]
VI_after__Init : ['1.201', '0.4290', '1.800', '0.1743', '1.800', '0.0917', '7.000', '0.7076', 1, 1, 1, 1, 1725014561.9091864]
VI_at__the_End : ['1.201', '0.4949', '1.800', '0.1387', '1.800', '0.1129', '7.000', '0.7082', 1, 1, 1, 1, 1725014620.616243]