TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_47_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-011-12 | FUSED_ID : 6359364768390750396
  IC_TEMP :  -51.93 | VDDM : 1126.35 | AUX_INT :   -7.52 | CsaBias :   75.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00677e-03 / 2
  ADC_P0  : -7.52201e-03 ± 2.14832e-02
  ADC_P1  : 8.31826e-03 ± 5.26625e-04
  ADC_P2  : -5.64838e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 1.18730e-04 / 2
  CSA_P0  : 5.95898e-02 ± 7.26779e-03
  CSA_P1  : 9.93179e-03 ± 5.47575e-04
  CSA_P2  : -4.67237e-05 ± 8.33893e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 4, 23, 57, 103, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [22, 28, 60, 61, 88, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1606', '1.800', '0.1355', '1.800', '0.0803', '7.000', '0.7075', 1, 1, 1, 1, 1725014842.8746028]
VI_after__Init : ['1.201', '0.1607', '1.800', '0.1355', '1.800', '0.0747', '7.000', '0.7073', 1, 1, 1, 1, 1725014850.9639778]
VI_at__the_End : ['1.201', '0.4955', '1.800', '0.1390', '1.800', '0.1107', '7.000', '0.7080', 1, 1, 1, 1, 1725014914.4734132]