TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_53_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-015-12 | FUSED_ID : 6359364768390750460
  IC_TEMP :  -59.46 | VDDM : 1133.26 | AUX_INT :   -7.40 | CsaBias :   68.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04384e-03 / 2
  ADC_P0  : -7.39830e-03 ± 2.18827e-02
  ADC_P1  : 8.47289e-03 ± 5.47683e-04
  ADC_P2  : -5.78981e-06 ± 2.71299e-06
  CSA_Chi2/NDF : 1.40803e-04 / 2
  CSA_P0  : 6.05565e-02 ± 7.91458e-03
  CSA_P1  : 1.04289e-02 ± 5.96307e-04
  CSA_P2  : -5.54977e-05 ± 9.08104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [14, 44, 89, 90, 108, 110, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 22, 29, 63, 89, 94, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2930', '1.800', '0.1963', '1.800', '0.0904', '7.000', '0.7071', 1, 1, 1, 1, 1725015228.0303576]
VI_after__Init : ['1.202', '0.2932', '1.800', '0.1958', '1.800', '0.0847', '7.000', '0.7072', 1, 1, 1, 1, 1725015236.189811]
VI_at__the_End : ['1.200', '0.4931', '1.800', '0.1423', '1.800', '0.1142', '7.000', '0.7076', 1, 1, 1, 1, 1725015298.3782437]