TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_55_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-016-11 | FUSED_ID : 6359364768390750475
  IC_TEMP :  -62.00 | VDDM : 1125.68 | AUX_INT :   -8.30 | CsaBias :   69.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01766e-03 / 2
  ADC_P0  : -8.29835e-03 ± 2.15534e-02
  ADC_P1  : 8.68145e-03 ± 5.41718e-04
  ADC_P2  : -6.58046e-06 ± 2.70294e-06
  CSA_Chi2/NDF : 2.00834e-04 / 2
  CSA_P0  : 6.23056e-02 ± 9.45239e-03
  CSA_P1  : 1.08644e-02 ± 7.12169e-04
  CSA_P2  : -6.29239e-05 ± 1.08455e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [9, 42, 50, 92, 93, 94, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [9, 26, 51, 58, 83, 110, 117, 118, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3247', '1.800', '0.1777', '1.800', '0.0953', '7.000', '0.7073', 1, 1, 1, 1, 1725015323.5073967]
VI_after__Init : ['1.201', '0.3249', '1.800', '0.1778', '1.800', '0.0894', '7.000', '0.7070', 1, 1, 1, 1, 1725015332.2777083]
VI_at__the_End : ['1.201', '0.4954', '1.800', '0.1432', '1.800', '0.1149', '7.000', '0.7077', 1, 1, 1, 1, 1725015398.4247358]