TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_57_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-017-11 | FUSED_ID : 6359364768390750491
  IC_TEMP :  -56.31 | VDDM : 1110.01 | AUX_INT :   -8.65 | CsaBias :   68.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18518e-03 / 2
  ADC_P0  : -8.64902e-03 ± 2.32812e-02
  ADC_P1  : 8.57767e-03 ± 5.76325e-04
  ADC_P2  : -6.58337e-06 ± 2.82797e-06
  CSA_Chi2/NDF : 1.37144e-04 / 2
  CSA_P0  : 6.00623e-02 ± 7.81106e-03
  CSA_P1  : 1.00903e-02 ± 5.88507e-04
  CSA_P2  : -5.05713e-05 ± 8.96227e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 21, 22, 49, 56, 77, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 8, 28, 33, 47, 99, 117, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2723', '1.800', '0.1674', '1.800', '0.0919', '7.000', '0.7080', 1, 1, 1, 1, 1725015420.4831479]
VI_after__Init : ['1.201', '0.2722', '1.800', '0.1675', '1.800', '0.0845', '7.000', '0.7070', 1, 1, 1, 1, 1725015429.3694978]
VI_at__the_End : ['1.201', '0.4901', '1.800', '0.1412', '1.800', '0.1142', '7.000', '0.7079', 1, 1, 1, 1, 1725015490.2149253]