TEST_NAME : Wafer
TEST_DATE : 24_08_30-12_58_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-018-11 | FUSED_ID : 6359364768390750507
  IC_TEMP :  -59.12 | VDDM : 1120.69 | AUX_INT :   -7.69 | CsaBias :   61.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14605e-03 / 2
  ADC_P0  : -7.69434e-03 ± 2.29119e-02
  ADC_P1  : 8.69280e-03 ± 5.80544e-04
  ADC_P2  : -6.60395e-06 ± 2.90513e-06
  CSA_Chi2/NDF : 1.35553e-04 / 2
  CSA_P0  : 6.01078e-02 ± 7.76565e-03
  CSA_P1  : 1.01805e-02 ± 5.85086e-04
  CSA_P2  : -5.34001e-05 ± 8.91016e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [40, 46, 76, 92, 112, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [16, 40, 44, 56, 57, 78, 87, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3296', '1.800', '0.1543', '1.800', '0.0973', '7.000', '0.7069', 1, 1, 1, 1, 1725015517.3689597]
VI_after__Init : ['1.201', '0.3297', '1.800', '0.1544', '1.800', '0.0915', '7.000', '0.7069', 1, 1, 1, 1, 1725015525.3603032]
VI_at__the_End : ['1.201', '0.4856', '1.800', '0.1395', '1.800', '0.1161', '7.000', '0.7076', 1, 1, 1, 1, 1725015580.6501067]