TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_01_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-020-11 | FUSED_ID : 6359364768390750539
  IC_TEMP :  -59.65 | VDDM : 1120.18 | AUX_INT :   -9.59 | CsaBias :   67.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43453e-03 / 2
  ADC_P0  : -9.58565e-03 ± 2.56414e-02
  ADC_P1  : 8.64002e-03 ± 6.39024e-04
  ADC_P2  : -6.49349e-06 ± 3.16819e-06
  CSA_Chi2/NDF : 1.34306e-04 / 2
  CSA_P0  : 6.16916e-02 ± 7.72982e-03
  CSA_P1  : 1.02342e-02 ± 5.82386e-04
  CSA_P2  : -5.44804e-05 ± 8.86905e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 4, 27, 36, 54, 58, 85, 92, 95, 97, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 13, 41, 65, 66, 82, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2809', '1.800', '0.1928', '1.800', '0.0974', '7.000', '0.7077', 1, 1, 1, 1, 1725015710.4454339]
VI_after__Init : ['1.201', '0.2809', '1.800', '0.1929', '1.800', '0.0900', '7.000', '0.7066', 1, 1, 1, 1, 1725015718.605778]
VI_at__the_End : ['1.201', '0.4854', '1.800', '0.1386', '1.800', '0.1155', '7.000', '0.7075', 1, 1, 1, 1, 1725015778.0291812]