TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_09_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-025-11 | FUSED_ID : 6359364768390750619
  IC_TEMP :  -56.94 | VDDM : 1123.40 | AUX_INT :  -10.29 | CsaBias :   73.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82379e-03 / 2
  ADC_P0  : -1.02927e-02 ± 2.89784e-02
  ADC_P1  : 8.39636e-03 ± 7.05382e-04
  ADC_P2  : -5.88382e-06 ± 3.42159e-06
  CSA_Chi2/NDF : 1.56757e-04 / 2
  CSA_P0  : 5.82969e-02 ± 8.35094e-03
  CSA_P1  : 1.00721e-02 ± 6.29183e-04
  CSA_P2  : -4.93908e-05 ± 9.58171e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 5, 12, 14, 30, 83, 105, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 18, 57, 64, 73, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2173', '1.800', '0.1467', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1725016193.0189304]
VI_after__Init : ['1.202', '0.2174', '1.800', '0.1467', '1.800', '0.0812', '7.000', '0.7072', 1, 1, 1, 1, 1725016201.8291817]
VI_at__the_End : ['1.201', '0.4926', '1.800', '0.1387', '1.802', '0.1136', '7.000', '0.7079', 1, 1, 1, 1, 1725016261.4116871]