TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_11_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-010-026-11 | FUSED_ID : 6359364768390750635
  IC_TEMP :  -56.15 | VDDM : 1133.84 | AUX_INT :   -6.34 | CsaBias :   68.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.17746e-04 / 2
  ADC_P0  : -6.34464e-03 ± 2.05564e-02
  ADC_P1  : 8.35529e-03 ± 5.21979e-04
  ADC_P2  : -4.71847e-06 ± 2.62528e-06
  CSA_Chi2/NDF : 1.09400e-04 / 2
  CSA_P0  : 5.98932e-02 ± 6.97640e-03
  CSA_P1  : 9.68616e-03 ± 5.25621e-04
  CSA_P2  : -4.41501e-05 ± 8.00459e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [21, 38, 50, 53, 76, 85, 92, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [37, 51, 73, 82]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1156', '1.800', '0.1155', '1.800', '0.0824', '7.000', '0.7074', 1, 1, 1, 1, 1725016290.07342]
VI_after__Init : ['1.202', '0.1156', '1.800', '0.1155', '1.800', '0.0767', '7.000', '0.7073', 1, 1, 1, 1, 1725016298.0859525]
VI_at__the_End : ['1.201', '0.4905', '1.800', '0.1388', '1.801', '0.1124', '7.000', '0.7081', 1, 1, 1, 1, 1725016353.9836679]