TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_51_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-004-01 | FUSED_ID : 6359364768390754369
  IC_TEMP :  -57.38 | VDDM : 1124.22 | AUX_INT :   -7.80 | CsaBias :   76.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.47779e-04 / 2
  ADC_P0  : -7.79974e-03 ± 2.08032e-02
  ADC_P1  : 8.49408e-03 ± 5.13210e-04
  ADC_P2  : -6.31508e-06 ± 2.50661e-06
  CSA_Chi2/NDF : 1.60172e-04 / 2
  CSA_P0  : 5.97850e-02 ± 8.44141e-03
  CSA_P1  : 1.01463e-02 ± 6.36000e-04
  CSA_P2  : -4.93423e-05 ± 9.68552e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 21, 22, 50, 89, 100, 101, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [10, 38, 58, 60, 77, 81, 113, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2925', '1.800', '0.1686', '1.800', '0.0875', '7.000', '0.7068', 1, 1, 1, 1, 1725018695.8176754]
VI_after__Init : ['1.201', '0.2929', '1.800', '0.1686', '1.800', '0.0817', '7.000', '0.7067', 1, 1, 1, 1, 1725018704.0069962]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1391', '1.800', '0.1131', '7.000', '0.7079', 1, 1, 1, 1, 1725018764.6654258]