TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_50_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-005-01 | FUSED_ID : 6359364768390754385
  IC_TEMP :  -56.94 | VDDM : 1123.40 | AUX_INT :  -18.69 | CsaBias :   89.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82379e-03 / 2
  ADC_P0  : -1.86949e-02 ± 2.95004e-02
  ADC_P1  : 8.40813e-03 ± 7.11973e-04
  ADC_P2  : -5.88382e-06 ± 3.42159e-06
  CSA_Chi2/NDF : 1.71737e-04 / 2
  CSA_P0  : 6.04524e-02 ± 8.74086e-03
  CSA_P1  : 1.02492e-02 ± 6.58561e-04
  CSA_P2  : -5.26924e-05 ± 1.00291e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 25, 56, 70, 89, 92, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 20, 80, 101, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2494', '1.800', '0.1474', '1.800', '0.0888', '7.000', '0.7070', 1, 1, 1, 1, 1725018599.533442]
VI_after__Init : ['1.201', '0.2493', '1.800', '0.1474', '1.800', '0.0831', '7.000', '0.7069', 1, 1, 1, 1, 1725018608.3705728]
VI_at__the_End : ['1.201', '0.4900', '1.800', '0.1408', '1.800', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1725018667.2282104]