TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_48_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-006-01 | FUSED_ID : 6359364768390754401
  IC_TEMP :  -49.78 | VDDM : 1125.71 | AUX_INT :   -8.79 | CsaBias :   71.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53671e-03 / 2
  ADC_P0  : -8.78896e-03 ± 2.66560e-02
  ADC_P1  : 8.09301e-03 ± 6.48108e-04
  ADC_P2  : -4.43134e-06 ± 3.14201e-06
  CSA_Chi2/NDF : 1.25178e-04 / 2
  CSA_P0  : 5.90782e-02 ± 7.46252e-03
  CSA_P1  : 9.72535e-03 ± 5.62247e-04
  CSA_P2  : -4.45282e-05 ± 8.56236e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [10, 55, 65, 69, 83, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [33, 36, 77, 105, 116, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3181', '1.800', '0.1260', '1.799', '0.0881', '7.000', '0.7080', 1, 1, 1, 1, 1725018503.7171419]
VI_after__Init : ['1.201', '0.3185', '1.800', '0.1260', '1.800', '0.0806', '7.000', '0.7070', 1, 1, 1, 1, 1725018511.9085448]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1366', '1.800', '0.1139', '7.000', '0.7080', 1, 1, 1, 1, 1725018575.2566767]