TEST_NAME : Wafer
TEST_DATE : 24_08_30-13_46_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-017-011-007-01 | FUSED_ID : 6359364768390754417
  IC_TEMP :  -65.81 | VDDM : 1109.38 | AUX_INT :  -11.21 | CsaBias :   64.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93848e-03 / 2
  ADC_P0  : -1.12055e-02 ± 2.98719e-02
  ADC_P1  : 8.42001e-03 ± 7.27829e-04
  ADC_P2  : -5.73313e-06 ± 3.55328e-06
  CSA_Chi2/NDF : 1.79086e-04 / 2
  CSA_P0  : 6.03012e-02 ± 8.92591e-03
  CSA_P1  : 1.03449e-02 ± 6.72503e-04
  CSA_P2  : -6.01948e-05 ± 1.02414e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [3, 17, 23, 47, 48, 61]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 22, 26, 96, 101, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4238', '1.800', '0.1536', '1.800', '0.1006', '7.000', '0.7082', 1, 1, 1, 1, 1725018407.9763386]
VI_after__Init : ['1.201', '0.4235', '1.800', '0.1544', '1.799', '0.0929', '7.000', '0.7069', 1, 1, 1, 1, 1725018416.0947533]
VI_at__the_End : ['1.201', '0.4684', '1.800', '0.1394', '1.800', '0.1184', '7.000', '0.7076', 1, 1, 1, 1, 1725018478.69415]